Quantification of subsurface damage in a brittle insulating ceramic by three-dimensional focused ion beam tomography.

نویسندگان

  • N Payraudeau
  • D McGrouther
  • K U O'Kelly
چکیده

In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.

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عنوان ژورنال:
  • Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

دوره 17 2  شماره 

صفحات  -

تاریخ انتشار 2011